CRISP High Resolution Low Temperature Ultrahigh Vacuum Scanning Tunneling/Noncontact Atomic Force Microscope

One of the CRISP Shared Facilities is a unique high-resolution, low-temperature ultrahigh vacuum scanning probe microscope for simultaneous operation in noncontact atomic force microscopy and scanning tunneling microscopy mode at 4 K.

NC-AFM image

Sunday, December 8, 2013