2017

O. Dagdeviren, C. Zhou, K. Zou, G. Simon, S. Albright, S. Mandal, M. Morales-Acosta, X. Zhu, S. Ismail-Beigi, F. Walker, C. Ahn, U. Schwarz, and E. Altman, Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films. DOI: 10.1002/admi.201601011